| Título: | Sensitivity analysis to compute advanced stochastic problems in uncertain and complex electromagnetic environments |
| Autores: |
Lalléchère, Sébastien; Clermont University, Blaise Pascal University
CNRS, UMR 6602, Pascal Institute Jannet, Basile; CEA, DAM, Gramat, F-46500 Clermont University, Blaise Pascal University CNRS, UMR 6602, Pascal Institute Bonnet, Pierre; Clermont University, Blaise Pascal University CNRS, UMR 6602, Pascal Institute Paladian, Françoise; Clermont University, Blaise Pascal University CNRS, UMR 6602, Pascal Institute |
| Fecha: | 2012-10-15 |
| Publicador: | Advanced Electromagnetics |
| Fuente: |
 |
| Tipo: |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Peer-reviewed Article |
| Tema: |
Electromagnetics; Electromagnetic compatibility Uncertainties; sensitivity analysis; EMC; stochastic collocation |
| Descripción: | This paper deals with the advanced integration of uncertainties in electromagnetic interferences (EMI) and electromagnetic compatibility (EMC) problems. In this context, the Monte Carlo formalism may provide a reliable reference to proceed to statistical assessments. After all, other less expensive and efficient techniques have been implemented more recently (the unscented transform and stochastic collocation methods for instance) and will be illustrated through uncertain EMC problems. Finally, we will present how the use of sensitivity analysis techniques may offer an efficient complement to rough statistical or stochastic studies. |
| Idioma: | Inglés |
1 On the Evaluation of the Shielding Effectiveness of Electrically Large Enclosure por Gifuni, Angelo; University of Parthenope,Sorrentino, Antonio; University of Parthenope,Fanti, Alessandro; University of cagliari,Ferrara, Giuseppe,Migliaccio, Maurizio; University of Parthenope,Mazzarella, Giuseppe; University of Cagliari,Corona, Federico; University of Parthenope | 6 Frequency Dependent Model of Leakage Inductance for Magnetic Components por Wilson, Peter R; School of Electronics and Computer Science
University of Southampton
Southampton
SO17 1BJ
United Kingdom |
2 Electromagnetic Absorbers based on High-Impedance Surfaces: From ultra-narrowband to ultra-wideband absorption por Costa, Filippo; University of Pisa, Department of Information Engineering, Via G. Caruso 16,
56122 Pisa, Italy,Monorchio, Agostino; University of Pisa, Department of Information Engineering, Via G. Caruso 16,
56122 Pisa, Italy | 7 Scattering forces on magneto-dielectric particles and the electromagnetic momentum density por Marques, Manuel I.; Universidad Autonoma de Madrid,Saenz, Juan J.; Universidad Autonoma de Madrid |
3 Novel antenna concepts via coordinate transformation por Tichit, Paul-Henri; Univ. Paris-Sud, CNRS,Burokur, Shah Nawaz; Univ. Paris-Sud, CNRS,Wu, Xinying; Univ. Paris-Sud, CNRS,Germain, Dylan; Univ. Paris-Sud, CNRS,de Lustrac, A.; IEF, Paris-Sud University | 8 Curvilinear vector finite difference approach to the computation of waveguide modes por Fanti, Alessandro; University of cagliari,Mazzarella, Giuseppe; University of cagliari,Montisci, Giorgio; University of cagliari |
4 Difficulties in teaching electromagnetism: an eight year experience at Pierre and Marie Curie University por Roussel, Hélène; UPMC, Univ. Paris 6,Hélier, Marc; UPMC, Univ. Paris 6 | 9 Roughness effect on the efficiency of dimer antenna based biosensor por Barchiesi, Dominique; University of technology of Troyes,Kessentini, Sameh; University of technology of Troyes |
5 Magnetic Shape Memory Alloys as smart materials for micro-positioning devices por Hubert, Arnaud; Institut Femto-ST, département AS2M
24 rue A. Savary
25000 Besancon,Calchand, Nandish; Institut Femto-ST, département AS2M
24 rue A. Savary
25000 Besancon,Le Gorrec, Yann; Institut Femto-ST, département AS2M
24 rue A. Savary
25000 Besancon,Gauthier, Jean-Yves; Laboratoire Ampère UMR 5005, Université de Lyon/CNRS
INSA LYON, bat. Saint-Exupery, Avenue Jean Capelle
69621 Villeurbanne Cedex | 10 Polarizability Matrix Extraction of a Bianisotropic Metamaterial from the Scattering Parameters of Normally Incident Plane Waves por Karamanos, Theodosios D.; Aristotle University of Thessaloniki,Dimitriadis, Alexandros I.; Aristotle University of Thessaloniki,Nikolaos V., Kantartzis; Aristotle University of Thessaloniki |