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Título: Experimental investigation of the fatigue characteristics of silver loop interconnectors
Autores: Kosseim, Nadia M.
Fecha: 1991
Publicador: McGill University - MCGILL
Fuente:
Tipo: Electronic Thesis or Dissertation
Tema: Engineering, Mechanical.
Descripción: Thin silver interconnectors are used in the space communication industry to ensure electrical conductivity between neighbouring electronic modules. In order to accommodate a large range of strains, these interconnectors are manufactured with a stress-relief loop shape. The main goal of this thesis is the study of the experimental aspects of the low cycle fatigue of these interconnectors.
The development of an in-situ automated fatigue testing procedure is described in detail. This procedure, which involves a miniature cycling device situated inside the vacuum chamber of a scanning electron microscope (SEM), was applied to several pure silver interconnectors with different loop heights. The use of the SEM enables observation, at high magnification, of the interconnector while it is being tested. A new parameter, $ kappa$, which includes the interconnector's geometrical characteristics, is introduced. The experimental results show that the fatigue life of interconnectors can be predicted from a knowledge of $ kappa$. A new approach to the measurement of strain at the top of interconnectors' loop is also proposed. The technique requires the use of the SEM and the deposition of 2 $ mu$m spheres as surface markers.
In addition to the experimental technique, a three-dimensional linear finite element analysis of the interconnectors is performed. This analysis is carried out using more than 2,000 elements and three different materials. Strain evaluations are found to be in good agreement with those experimentally obtained.
Idioma: en