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Research of the Defect Model Based on Similarity and Association Rule Han, Wanjiang; Beijing University of Posts and Telecommunication - Jiang, Lixin; Beijing University of Posts and Telecommunication - Zhang, Xiaoyan; Beijing University of Posts and Telecommunication - Lu, Tianbo; Beijing University of Posts and Telecommunication - Yi, Sun; Beijing University of Posts and Telecommunication - Yan, Li; Beijing University of Posts and Telecommunication - Li, Weijian; Beijing University of Post and Telecommunication
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