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1.
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Application of Near-Field Emission Processing for Microwave Circuits under Ultra-Short Duration Perturbations
Liu, Yang; IRSEEM, EA 4353, ESIGELEC, Av. Galilée, BP 10024, 76801 Saint Etienne du Rouvray, France - Ravelo, Blaise; IRSEEM, EA 4353, ESIGELEC, Av. Galilée, BP 10024, 76801 Saint Etienne du Rouvray, France
| Formato: |
info:eu-repo/semantics/article, info:eu-repo/semantics/publishedVersion, Peer-reviewed Article |
| Enlaces: |
 
This paper is dealing with a time-frequency modeling method of electromagnetic (EM) near-field (NF) radiated by electronic devices excited by transient pulse signals. The model developed enables to calculate the EM NF maps at different distances from the given device…
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| Fecha: |
2012-10-16 |
| Recurso: |
Advanced Electromagnetics |
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