|
1.
|
A Low Cost C8051F006 SoC-Based Quasi-Static C-V Meter for Characterizing Semiconductor Devices
Rahmawati, Endah; Universitas Negeri Surabaya - Ekawita, Riska; Universitas Bengkulu - Budiman, Maman; Institut Teknologi Bandung - Abdullah, Mikrajuddin; Institut Teknologi Bandung - Khairurrijal, Khairurrijal; Institut Teknologi Bandung
| Formato: |
info:eu-repo/semantics/article, info:eu-repo/semantics/publishedVersion |
| Enlaces: |
 
Based on a C8051F006 SoC (system on-a-chip), a simple and low cost quasi-static capacitance-voltage (C-V) meter was designed and developed to obtain C-V characteristics of semiconductor devices. The developed C-V meter consists of a capacitance meter, a programmable voltage source,…
|
| Fecha: |
2012-10-01 |
| Recurso: |
TELKOMNIKA: Indonesian journal of electrical engineering |
|
