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1.
Reliability Estimation based on Step-Stress Accelerated Degradation Testing by Unequal Interval Time Series Analysis
 Wang, Li; Beijing Technology and Business University - Liu, Zaiwen; Beijing Technology and Business University - Yu, Chongchong; Beijing Technology and Business University
Formato: info:eu-repo/semantics/article, info:eu-repo/semantics/publishedVersion
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Fecha: 2013-10-01
Recurso: TELKOMNIKA: Indonesian journal of electrical engineering