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Research of the Defect Model Based on Similarity and Association Rule
Han, Wanjiang; Beijing University of Posts and Telecommunication - Jiang, Lixin; Beijing University of Posts and Telecommunication - Zhang, Xiaoyan; Beijing University of Posts and Telecommunication - Lu, Tianbo; Beijing University of Posts and Telecommunication - Yi, Sun; Beijing University of Posts and Telecommunication - Yan, Li; Beijing University of Posts and Telecommunication - Li, Weijian; Beijing University of Post and Telecommunication
Formato: |
info:eu-repo/semantics/article, info:eu-repo/semantics/publishedVersion |
Enlaces: |
In order to detect defects efficiently and improve the quality of products, this paper puts forward the concept about defect classification model and defect association model by a lot of defect data. The technology of similarity is applied to defect…
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Fecha: |
2013-12-29 |
Recurso: |
TELKOMNIKA: Indonesian journal of electrical engineering |
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