Aproximadamente 451 registro(s) hasta el momento: (knowledge)
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Recurso libre 
1.
Mapping the R&D knowledge network, Mapping the research and development knowledge network
Liew, Kou-Yew, 1972-
Formato: Thesis
Enlaces:
Fecha: 2005-06-02
Recurso: MIT

Recurso libre 
2.
3-round weak zero-knowledge proofs for [Nu] [Rho], Three-round weak ZK proofs for [Nu] [Rho]
Lim, Dah-Yoh, 1978-
Formato: Thesis
Enlaces:
Fecha: 2005-09-27
Recurso: MIT

Recurso libre 
3.
Topology of learning and correction in dynamic balance
Welti-Santos, Larissa, 1978-
Formato: Thesis
Enlaces:
Fecha: 2005-09-06
Recurso: MIT

Recurso libre 
4.
Effects of surface properties on solder bump formation by direct droplet deposition
Hsiao, Wen Kai, 1972-
Formato: Thesis
Enlaces:
Fecha: 2005-09-06
Recurso: MIT

Recurso libre 
5.
Performance-Driven Microfabrication-Oriented Methodology for MEMS Conceptual Design with Application in Microfluidic Device Design
Deng, Y.-M. - Lu, Wen Feng
Formato: Article
Enlaces:
Fecha: 2004-12-14
Recurso: MIT

Recurso libre 
6.
Design of compliant mechanisms for attenuation of unidirectional vibrations in rotational systems
Szczesny, Spencer E., 1981-
Formato: Thesis
Enlaces:
Fecha: 2005-09-26
Recurso: MIT

Recurso libre 
7.
Border-crossing knowledge networking among multinational firms : the case of R&D facilities
Shirvani-Mahdavi, Ali (Ali Agha), 1965-
Formato: Thesis
Enlaces:
Fecha: 2005-09-27
Recurso: MIT

Recurso libre 
8.
The knowledge evolution framework : a knowledge management perspective on the impact of knowledge segregation on product development projects
Chi, Jeffrey C. (Jeffrey Chien-Chuen)
Formato: Thesis
Enlaces:
Fecha: 2005-08-23
Recurso: MIT

Recurso libre 
9.
Integration of expert knowledge into computer-controlled databases in the medical domain : HEMAVID, a case study
Chueh, Henry C
Formato: Thesis
Enlaces:
Fecha: 2005-10-07
Recurso: MIT

Recurso libre 
10.
Knowledge transfer across generations : the impact on product development performance in the automobile industry
Aoshima, Yaichi
Formato: Thesis
Enlaces:
Fecha: 2005-08-17
Recurso: MIT