Detailed knowledge of the tip apex structure is necessary for quantitative comparison between theory-based simulations and experimental observations of tip-substrate interactions in scanning probe microscopy (SPM). Here, we discuss field ion microscopy (FIM) techniques to characterize and atomically define SPM…
Fecha:
2005,
Recurso:
McGill University - MCGILL
CIC - Centro de Información y Conocimiento Johannes Gutenberg ®