Colección: TEMAS
Temas | Cantidad |
---|---|
VLSI | 1 |
VLSI design for testability | 1 |
artificial intelligence | 1 |
circuit testing | 1 |
knowledge representation | 1 |
knowledge-based systems | 2 |
testsgeneration | 2 |
Temas | Cantidad |
---|---|
VLSI | 1 |
VLSI design for testability | 1 |
artificial intelligence | 1 |
circuit testing | 1 |
knowledge representation | 1 |
knowledge-based systems | 2 |
testsgeneration | 2 |