| Título: | The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit |
| Autores: |
Ganiyev, Artem Vitasek, Jan |
| Fecha: | 2010-06-30 |
| Publicador: | Advances in Electrical and Electronic Engineering |
| Fuente: |
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| Tipo: |
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| Tema: | Large scale integration circuit; very large scale integration circuit; integrated circuit; memory component; program equipment; telecommunication system. |
| Descripción: | This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits. |
| Idioma: | cze |
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