| Título: | An x-ray method for measuring the thickness of thin crystalline films |
| Autores: | |
| Fecha: |
2004-03-03 2004-03-03 1946 |
| Publicador: | MIT |
| Fuente: |
 |
| Tipo: | |
| Tema: |
TK7855.M41 R43 no.17 Thin films |
| Descripción: |
[by] A. Eisenstein. "Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." Includes bibliographical references. |
| Idioma: | Inglés |
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