| Título: | Development of a Machine Vision System for Solar Wafer Counting |
| Autores: |
Wang, Nan; Agricultural University of Hebei Zhang, Shuguang; Agricultural University of Hebei Cheng, Man; Agricultural University of Hebei Cai, Zhenjiang; Agricultural University of Hebei |
| Fecha: | 2014-05-01 |
| Publicador: | TELKOMNIKA: Indonesian journal of electrical engineering |
| Fuente: |
 |
| Tipo: |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |
| Tema: |
College of Electrical and Mechanical Engineering, Agricultural University of Hebei, Uneven Illumination, Image Pre-Processing, Counting Algorithm |
| Descripción: | The traditional manual counting wafers leaded to the silicon wafer cracked by operating frequently. Instead of the manual work, this paper proposed a system to counting wafers based on Machine Vision theory and Image Processing algorithm. We designed a counter system and adopted infrared led as parallel illumination source. In image pre-processing, this paper presented a series of algorithms, which contained image smoothing, uneven image correction and image morphology operation. This paper proposed a vertical projection counting based on statistics analysis substitute for the Hough straight lines detection, and the method had been achieved ideal effects by experimental results. |
| Idioma: | No aplica |