Título: Trilayer Graphene Nanoribbon Field Effect Transistor Analytical Model
Autores: Rahmani, Meisam; Faculty of Electrical Engineering, Universiti Teknologi Malaysia (UTM), 81310 Johor, Malaysia
Ismail, Razali; Faculty of Electrical Engineering, Universiti Teknologi Malaysia (UTM), 81310 Johor, Malaysia
Ahmadi, Mohammad Taghi; Nanotechnology Research Center Nanoelectronic Group, Physics Department, Urmia University, 57147 Urmia, Iran
Rahmani, Komeil; Department of Electrical, Computer and Biomedical Engineering, Qazvin Branch, Islamic Azad University, Qazvin, Iran
Pourasl, Ali H.; Faculty of Electrical Engineering, Universiti Teknologi Malaysia (UTM), 81310 Johor, Malaysia
Fecha: 2014-04-01
Publicador: TELKOMNIKA: Indonesian journal of electrical engineering
Fuente:
Tipo: info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Tema: Technology; Electrical, Electronics and Computer Engineering
Trilayer Graphene Nanoribbon (TGN); Energy Band Structure, Carrier Concentration; Field Effect Transistor; Current-voltage characteristic
Descripción: The approaching scaling of Field Effect Transistors (FETs) in nanometer scale assures the smaller dimension, low-power consumption, low energy delay production, and high density as well as high speed in processor. Trilayer graphene nanoribbon with different stacking arrangements (ABA and ABC) indicates different electrical properties. Based on this theory, ABA-stacked trilayer graphene nanoribbon application as a field effect transistor channel is investigated in this study. The energy band structure of ABA-stacked trilayer graphene nanoribbon in the presence of a perpendicular electric field using a tight-binding model is presented, and the effect of applied voltage on the curvature of the E-K graph is analytically studied. Moreover, an analytical model of carrier statistics for ABA-stacked trilayer graphene nanoribbon in corporation with a numerical solution is presented and current-voltage characteristic of trilayer graphene nanoribbon FET as a one-dimensional device is explored. In fact, the proposed model can be applied as a useful tool to optimize the nanoscale FET based device performance.
Idioma: No aplica